P-Type Zno Films Deposited by Dc Reactive Magnetron Sputtering at Different Ammonia Concentrations

JG Lu,YZ Zhang,ZZ Ye,L Wang,BH Zhao,JY Huang
DOI: https://doi.org/10.1016/s0167-577x(03)00054-5
IF: 3
2003-01-01
Materials Letters
Abstract:Films were prepared on α-Al2O3 (0001) substrates by DC reactive magnetron sputtering in NH3–O2 ambient at different ammonia concentrations (from 0% to 100%). Results showed that N-doped, p-type ZnO films with c-axis orientation were achieved at the ammonia concentrations of 25%, 50% and 75%. The carrier density was typically 1017 cm−3, the resistivity was around 30 Ω cm and the transmittance was about 90% in visible region. At 0% ammonia concentration, intrinsic ZnO films with c-axis orientation were obtained. At 100% ammonia concentration, however, the films deposited are zinc polycrystal films.
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