Femtosecond modulated reflectance investigation of In0.5Ga0.5P and In0.5Ga0.5P0.99As0.01 lattice-matched to GaAs (100) substrate

Sheng Lan,Zhang-Yuan Chen,Wan-Jing Xu,Cheng-Qing Yang,Hong-Du Liu
DOI: https://doi.org/10.1016/0038-1098(94)00818-3
IF: 1.934
1995-01-01
Solid State Communications
Abstract:Femtosecond modulated reflecrive spectra of InGaP and InGaPAs lattice-matched to GaAs (100) substrates were investigated. The samples used for measurements were grown at high and low temperature under different P vapor pressure. We found that the epilayers free from deep level have a much longer photocarrier lifetime ( longer than 100 ps) comparing with those with deep level ( about 10 ps). We also found that InGaP and InGaPAs epilayers with and without deep level have different responding behaviour to the ultrashort laser pulse.
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