Development and Evolution of Biaxial Texture of Rolled Nickel Tapes by Ion Beam Bombardment for High Tc Coated Conductors

SS Wang,K Wu,K Shi,Q Liu,Z Han
DOI: https://doi.org/10.1016/j.physc.2004.04.026
2004-01-01
Abstract:High quality YBa2Cu3O7−x films on metallic substrates with high critical current densities well over 106 A/cm2 can be prepared by the rolling assisted biaxially textured substrates (RABiTS) method. Nickel or its alloys have been used as biaxially textured substrates formed through a specific rolling and high temperature annealing procedures. In this paper, we report a newly developed process for developing biaxial texture in rolled Ni tape by argon ion beam bombardment. It is named the ion-beam structure modification (ISM) process. In the ISM processed Ni foils, X-ray diffraction ω scans showed the full width-half maximum (FWHM) value of the (200) peak was 5.7°. And the electron back scattering diffraction (EBSP) analysis based on scanning electron microscopy showed good {100} 〈001〉 cubic orientation and the mean grain size was determined as about 25 μm. The texture evolution of rolled Ni foils during ISM process is reported also. For ISM process, local temperature elevation and distribution arises from the ion bombardment, coupled with anisotropic incident ion penetration and propagation as a result of channeling effects in the metal lattice, are expected to play the major roles in the development of grain reorientation in the Ni foil. Due to the simplicity and efficiency of the ISM process, the technique shows a great promise for application in the industrial scale production of long-lengths of superconductor tapes.
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