Ion-Beam Bombardment Induced Texture in Nickel Substrates for Coated High-T-C Superconductors

SS Wang,K Wu,Y Zhou,A Godfrey,J Meng,ML Liu,Q Liu,W Liu,Z Han
DOI: https://doi.org/10.1088/0953-2048/16/6/101
2003-01-01
Abstract:Biaxially textured metal substrates are often used for making YBa2Cu3O7-x coated conductors with high critical current density. Generally, specific rolling and high-temperature annealing procedures are required to obtain the biaxial texture for metal substrates. Here, we report on a new method for developing strongly biaxially textured grain structure in rolled nickel tape by argon ion-beam bombardment. X-ray diffraction (XRD) theta-2theta scans have shown that a (200) diffraction peak intensity of the Ni foil processed by ion-beam structure modification (ISM) is two orders of magnitude greater than that of cold-rolled foil, while the (111) and (220) intensities are very weak. In the ISM processed Ni foils, from the rocking curve, the full width at half maximum (FWHM) value of the (200) peak has been found to be less than 5.9degrees. whilst the in-plane FWHM obtained from a pole figure analysis is just 8degrees. We discuss the possible mechanisms leading to the texture changes during ISM.
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