Fabrication of high hole-carrier density p-type ZnO thin films by N–Al co-doping

Zhang Xiaodan,Fan Hongbing,Zhao Ying,Sun Jian,Wei Changchun,Zhang Cunshan
DOI: https://doi.org/10.1016/j.apsusc.2006.08.010
IF: 6.7
2007-01-01
Applied Surface Science
Abstract:In order to obtain p-type ZnO thin films, effect of atomic ratio of Zn:N:Al on the electronic and structural characteristic of ZnO thin films was investigated. Hall measurement indicated that with the increase of Al doping, conductive type of as-grown ZnO thin films changed from n-type to p-type and then to n-type again, reasons are discussed in details. Results of X-ray diffraction revealed that co-doped ZnO thin films have similar crystallization characteristic (002 preferential orientation) like that of un-doping. However, SEM measurement indicated that co-doped ZnO thin films have different surface morphology compared with un-doped ZnO thin films. p-type ZnO thin films with high hole concentration were obtained on glass (4.6×1018cm−3) and n-type silicon (7.51×1019cm−3), respectively.
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