High-Frequency Noise Characteristics of Si/SiGe HBT's

ZHANG Wan-rong,QIU Jian-jun,JIN Dong-yue,ZHANG Jing,ZHANG Zheng-yuan,LIU Dao-guang,WANG Jian-an,XU Xue-liang,CHEN Guang-bing
2006-01-01
Abstract:Based on Y parameters of device,high-frequency noise characteristics of Si/Si_(1-x)Ge_x HBT's is simulated.As the Ge fraction increases,the high-frequency minimum noise figure of Si/Si_(1-x)Ge_x HBT decreases.The results show that Si/SiGe HBTs have excellent high-frequency noise characteristics,compared with Si BJT.
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