Organic Dielectric Indium Zinc Oxide Thin Film Transistors

李桂锋,冯佳涵,周俊,张群
DOI: https://doi.org/10.3969/j.issn.1007-2780.2010.04.022
2010-01-01
Chinese Journal of Liquid Crystals and Displays
Abstract:Amorphous indium zinc oxide thin films were prepared by direct current magnetron sputtering on glass substrates at room temperature.The organic dielectric layer poly(4-vinylphenol)were prepared by spin coating method.With IZO films as channel layers,poly(4-vinylphenol)as dielectric layers,thin film transistors were fabricated at room temperature,showing depleted mode operation with good saturation characteristics,threshold vol-tage of 3.8 V,mobility of 25.4 cm2·V-1·s-1 and on/off ratio of 106.This shows organic dielectric layer indium zinc oxide thin film transistor can be prepared at low temperature.
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