Indium zinc oxide semiconductor thin films deposited by dc magnetron sputtering at room temperature

G.F. Li,J. Zhou,Y.W. Huang,M. Yang,J.H. Feng,Q. Zhang
DOI: https://doi.org/10.1016/j.vacuum.2010.03.004
IF: 4
2010-01-01
Vacuum
Abstract:Amorphous indium zinc oxide (IZO) thin films were prepared on glass substrates by dc magnetron sputtering at room temperature. The resistivity of IZO films could be controlled between 3.8 × 10−3 and 2.5 × 106 Ω cm by varying the oxygen partial pressure during deposition, while keep the average transmittance over 83%. With IZO films as channel layers, whose surface root-mean-square roughness was less than 1 nm, thin film transistors were fabricated at room temperature, showing enhanced mode operation with good saturation characteristics, mobility of 5.2 cm2 V−1 s−1, threshold voltage of 0.94 V and on/off ratio of ∼104.
What problem does this paper attempt to address?