Computer-aided Interferometer for Testing Microdisplacement of Piezoelectric Ceramics

Y Zhu,JB Chen,Q Wang,L Chen,RH Zhu
DOI: https://doi.org/10.1002/(sici)1098-2760(19990705)22:1<72::aid-mop18>3.3.co;2-n
IF: 1.311
1999-01-01
Microwave and Optical Technology Letters
Abstract:This paper proposes a kind of computer-aided contact-type interferometer for testing the microdisplacement of piezoelectric ceramics (PZT). Its accuracy is better than 0.01 μm. A data acquisition system, including a CCD, grabber, etc., has been used to detect and digitize interferograms. This system analyzes a two-dimensional interferogram automatically and quickly, while both calibrate with monochromatic fringes and test with achromatic fringes. Software has been used to analyze the two-dimensional interferogram and to test the nonlinearity and hysteresis of PZT. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 22: 72–74, 1999.
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