Effects of Cu/In Molar Ratio and Sulfurizing Temperature on Performance of CIS Thin Films

杨宇,张弓,庄大明
IF: 4
2009-01-01
Vacuum
Abstract:Cu/In precursors have been prepared on glass substrate by mid-frequency AC magnetron sputtering technique. CuInS2 (CIS) absorber layers were obtained by sulfurization with solid element sulfuriazation method. The influences of the Cu/In molar ratio in the precursors and the sulfurization temperature on the microstructure, and the energy gap of the CIS thin films were investigated. Raman spectrum, XRD and near-infrared transmission curves were employed to analyze the microstructures and the band gap of the CIS absorbers, respectively. The results show that the intensity of CH phase increased by increasing the Cu/In molar ratio and the sulfurization temperature with the intensity of CuAu (CA) phase decreasing. The CH phase dominated in the layers when the sulfurization temperature was 600℃. The band gaps of the CuInS2 increased when the CuIn molar ratio increased and the sulfurization temperatre increased. The energy gap came up to 1.40eV when the Cu/In molar ratio was 1.05 and the sulfurization temperature was 500℃.
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