Dependence of Reversible and Irreversible Failures of Semiconductor Devices on the Repetition Rate of Powerful Pulse Electromagnetic Interferences

V. G. Usychenko,L. N. Sorokin,A. A. Sasunkevich,Sorokin, L. N.
DOI: https://doi.org/10.1134/s1064226923120197
2024-03-02
Journal of Communications Technology and Electronics
Abstract:Mechanisms of reversible and irreversible failures that occur in microwave semiconductor devices, microcircuits, and microprocessors under the impact of powerful electromagnetic pulses, either single or periodic, are analyzed. It is shown that, in microprocessors, failures of both types are generated by the electrothermal instabilities, being developed within negligibly small volumes of a device. The dependences of the threshold energy of failures on the pulse amplitude, duration, and repetition rate are explained. The results of the calculation are consistent with the experimental data.
telecommunications,engineering, electrical & electronic
What problem does this paper attempt to address?