Abstract:V 2 O 5 and 1 mol% RE-doped V 2 O 5 (RE = La, Er, Yb) thin films were prepared using the sol–gel method. The structure and morphology of the prepared films were investigated using XRD, HRTEM, SAD electron microscopy, FESEM, and EDS. XRD analysis revealed a strong c-axis orientation and noncrystalline structure. Gaussian fitting of the XRD peaks indicates a decrease in the crystallite size with RE doping, which is attributed to the increased internal stress and lattice distortion. TC analysis showed a preferred orientation along the c-axis. HRTEM observations confirmed the crystallinity of the nanosheets. The absorption, transmittance, and reflectance spectra were measured for normal-incidence light in the wavelength range 190–1100 nm. The obtained spectra were used to investigate the linear and non-linear optical properties via various optical parameters, including static refractive index, optical band gap energy, Urbach band tail energy, dispersion energy parameters using the Wemple and DiDomenico (WDD) single-oscillator model, nonlinear refractive index and first and third optical susceptibilities. The doped films exhibited lower optical bandgaps and the investigated linear and nonlinear optical parameters showed significant effects in RE-doped films compared to pure V 2 O 5 , indicating potential for various optical applications. The optical limiting of the prepared films was studied using two laser sources (650 nm and 533 nm), revealing significant optical limiting for RE-doped films compared with pure V 2 O 5 films, where the optical limiting effect is related to the oscillator strength and Urbach band tail energy. This study shows that rare-earth doping has a significant impact on the structural and optical properties of V 2 O 5 thin films, making them promising materials for various applications, such as optoelectronic devices and nonlinear optical applications.

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