Abstract:Tantalum electrolytic capacitors have performance advantages of long life, high temperature stability, and high energy storage capacity and are essential micro-energy storage devices in many pieces of military mechatronic equipment, including penetration weapons. The latter are high-value ammunition used to strike strategic targets, and precision in their blast point is ensured through the use of penetration fuzes as control systems. However, the extreme dynamic impact that occurs during penetration causes a surge in the leakage current of tantalum capacitors, resulting in a loss of ignition energy, which can lead to ammunition half-burst or even sometimes misfire. To address the urgent need for a reliable design of tantalum capacitor for penetration fuzes, in this study, the maximum acceptable leakage current of a tantalum capacitor during impact is calculated, and two different types of tantalum capacitors are tested using a machete hammer. It is found that the leakage current of tantalum capacitors increases sharply under extreme impact, causing functional failure. Considering the piezoresistive effect of the tantalum capacitor dielectric and the changes in the contact area between the dielectric and the negative electrode under pressure, a force–electric simulation model at the microscale is established in COMSOL software. The simulation results align favorably with the experimental results, and it is anticipated that the leakage current of a tantalum capacitor will experience exponential growth with increasing pressure, ultimately culminating in complete failure according to this model. Finally, the morphological changes in tantalum capacitor sintered cells both without pressure and under pressure are characterized by electron microscopy. Broken particles of Ta–Ta2O5 sintered molecular clusters are observed under pressure, together with cracks in the MnO2 negative base, proving that large stresses and strains are generated at the micrometer scale.

Influence of Capability of Ta_2O_5 Dielectric Film on Performance of Wet Tantalum Electrolytic Capacitor

I-V Characteristics of High Dielectric Constant Tantalum Oxide Films

Failure behavior of tantalum electrolytic capacitors under extreme dynamic impact: Mechanical–electrical model and microscale characterization

I-V Characteristics of Tantalum Oxide Film and the Effect of Defects on Its Electrical Properties

Electrical characterization of Ta2O5 films deposited by laser reactive ablation of metallic Ta

Insights into the breakdown mechanism of anodic oxide film

Formation and Property of Al2O3-TiO2 Composite Anodic Oxide Film on DC-Etched Al Foil for Al Electrolytic Capacitors

XPS analysis and electrical conduction mechanisms of atomic layer deposition grown Ta2O5 thin films onto p-Si substrates

AFM Study on the Surface Morphologies of TiN Films Prepared by Magnetron Sputtering and Al2O3 Films Prepared by Atomic Layer Deposition

High-Performance TiO 2 /ZrO 2 /TiO 2 Thin Film Capacitor by Plasma-Assisted Atomic Layer Annealing

Influence of Ta and TaN Bottom Electrodes on Electrical Performances of MIM Capacitors with Atomic-Layer-deposited HfO2 Dielectric

Deposition of Tantalum Oxide Films by Uv Laser Reactive Ablation in O-3 Ambient

Study on the Crystallinity and Oxidation States of Nanoporous Anodized Tin Oxide Films Regulated by Annealing Treatment for Supercapacitor Application

An investigation on the on dielectric, ferroelectric properties and failure mechanism for the 0805X7R multi-layer ceramic capacitor

Surface enlargement of tantalum capacitor foils by pulsed direct current etching and laser cladding

High Density Al2O3/TaN-based Metal–insulator–metal Capacitors in Application to Radio Frequency Integrated Circuits

Barrier Metal Properties of Amorphous Tantalum Nitride Thin Films between Platinum and Silicon deposited using Remote Plasma Metal Organic Chemical Vapor Method

Voltage oscillations during anodizing process of aluminum and their suppression

Annealing effects on the optical and electrochemical properties of tantalum pentoxide films

Fabrication and Characterization of the Hierarchical AAO Film and AAO-MnO2 Composite As the Anode Foil of Aluminum Electrolytic Capacitor

Model of Dielectric Breakdown in Hafnia-Based Ferroelectric Capacitors