Measurement and Analysis of Surface Profiles by Optical Scattering Method

Bin Chen
2006-01-01
Abstract:Evaluation and measurement of surface profiles are very important especially to short-wavelength optical research.A linear system treatment of short-wavelength surface scattering theory is introduced,and based on this,a new inverse scattering mathematical model of soft X-ray grazing incidence optics is established.By using these scattered light distributions of super-smooth surfaces measured by a soft X-ray reflectometer,the surface profiles of super-smooth surfaces are computed by means of inverse scattering mathematical model of soft X-ray grazing incidence optics.The calculating results are in accordance with those measured by WYKO.It can be concluded that the soft X-ray grazing incidence optical scattering method can calculate micro-roughness and surface auto correlation function of smooth surface accurately,and can give optical surface profiles intuitively.
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