Abstract:Context. The imaging sharpness of an X-ray telescope is chiefly determined by the optical quality of its focusing optics, which in turn mostly depends on the shape accuracy and the surface finishing of the grazing-incidence X-ray mirrors that compose the optical modules. To ensure the imaging performance during the mirror manufacturing, a fundamental step is predicting the mirror point spread function (PSF) from the metrology of its surface. Traditionally, the PSF computation in X-rays is assumed to be different depending on whether the surface defects are classified as figure errors or roughness. This classical approach, however, requires setting a boundary between these two asymptotic regimes, which is not known a priori. Aims. The aim of this work is to overcome this limit by providing analytical formulae that are valid at any light wavelength, for computing the PSF of an X-ray mirror shell from the measured longitudinal profiles and the roughness power spectral density, without distinguishing spectral ranges with different treatments. Methods. The method we adopted is based on the Huygens-Fresnel principle for computing the diffracted intensity from measured or modeled profiles. In particular, we have simplified the computation of the surface integral to only one dimension, owing to the grazing incidence that reduces the influence of the azimuthal errors by orders of magnitude. The method can be extended to optical systems with an arbitrary number of reflections – in particular the Wolter-I, which is frequently used in X-ray astronomy – and can be used in both near- and far-field approximation. Finally, it accounts simultaneously for profile, roughness, and aperture diffraction. Results. We describe the formalism with which one can self-consistently compute the PSF of grazing-incidence mirrors, and we show some PSF simulations including the UV band, where the aperture diffraction dominates the PSF, and hard X-rays where the X-ray scattering has a major impact on the PSF degradation. The results are validated with ray-tracing simulations, or by comparison with the analytical computation of the half-energy width based on the known scattering theory, where these approaches are applicable. Finally, we validate this by comparing the simulated PSF of a real Wolter-I mirror shell with the measured PSF in hard X-rays.

Characterizing curved surface roughness of Wolter-I X-ray grazing incidence telescope

Studies of the super-smooth mirror roughness by grazing incidence X-ray scattering method

Roughness Characterization of Well-Polished Surfaces by Measurements of Light Scattering Distribution

Study of the relationship between metrological characterization and angular resolution in grazing-incidence X-ray optics

Roughness scattering in X-ray grazing-incidence telescopes

Simulation method of Wolter type I grazing incidence telescope imaging of an X-ray region

Surface scattering of soft X-ray optics

Analytical evaluation of the X-ray scattering contribution to imaging degradation in grazing-incidence X-ray telescopes

Effect of the Surface Roughness on X-ray Absorption by Mirrors Operating at Extremely Small Grazing Angles.

Reflection of X-Rays from A Rough Surface at Extremely Small Grazing Angles

Measurement and Analysis of Surface Profiles by Optical Scattering Method

Measurement of Soft X-Ray Grazing Incidence Optical Scattering Phenomena

X-ray Wavefront Characterization with Grating Interferometry Using an X-Ray Microfocus Laboratory Source

Wavefront Sensing and Surface Shape Measurement Based on Microfocus X-Ray Grating Interferometer

Effects of mirror surface roughness on encircled energy for far ultraviolet telescopes

Development and testing of glass substrate Wolter-1 X-ray focusing mirror

Electromagnetic scattering characteristic of Gaussian rough coated objects in terahertz

Ray Tracing Method for the Evaluation of Grazing Incidence X-Ray Telescopes Described by Spatially Sampled Surfaces.

Mirrors for X-ray telescopes: Fresnel diffraction-based computation of point spread functions from metrology

High reflectance broadband thin films used in X-ray telescopes

The Backscattering Characteristics and Accelerated Arithmetic for Complex Rough Target in Thz and Laser Bands