Deposition and Characterization of RP-ALD SiO2 Thin Films with Different Oxygen Plasma Powers
Xiao-Ying Zhang,Yue Yang,Zhi-Xuan Zhang,Xin-Peng Geng,Chia-Hsun Hsu,Wan-Yu Wu,Shui-Yang Lien,Wen-Zhang Zhu
DOI: https://doi.org/10.3390/nano11051173
IF: 5.3
2021-04-29
Nanomaterials
Abstract:In this study, silicon oxide (SiO2) films were deposited by remote plasma atomic layer deposition with Bis(diethylamino)silane (BDEAS) and an oxygen/argon mixture as the precursors. Oxygen plasma powers play a key role in the quality of SiO2 films. Post-annealing was performed in the air at different temperatures for 1 h. The effects of oxygen plasma powers from 1000 W to 3000 W on the properties of the SiO2 thin films were investigated. The experimental results demonstrated that the SiO2 thin film growth per cycle was greatly affected by the O2 plasma power. Atomic force microscope (AFM) and conductive AFM tests show that the surface of the SiO2 thin films, with different O2 plasma powers, is relatively smooth and the films all present favorable insulation properties. The water contact angle (WCA) of the SiO2 thin film deposited at the power of 1500 W is higher than that of other WCAs of SiO2 films deposited at other plasma powers, indicating that it is less hydrophilic. This phenomenon is more likely to be associated with a smaller bonding energy, which is consistent with the result obtained by Fourier transformation infrared spectroscopy. In addition, the influence of post-annealing temperature on the quality of the SiO2 thin films was also investigated. As the annealing temperature increases, the SiO2 thin film becomes denser, leading to a higher refractive index and a lower etch rate.
materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology,chemistry