The Elementary Research of Ferroelectric Domain of (pb,la)tio_3 Ferroelectric Thin Film

Xiao Dingquan
2005-01-01
Abstract:Piezoresponse force micrpscopy(PFM) and Scanning nonlinear dielectric microscopy (SNDM) are recently applied to measure piezoelectric coefficient. Nonlinear dielectric constant,out-of-plane and in-plane domain structures of PLT thin films were observed with scanning nonlinear dielectric microscopy (SNDM),the lateral PFM(LPFM) and the vertical PFM(VPFM) respectively. The experiment results showed abundant in-plane and out-of-plane domains were found;the distribution of dielectric constant was nonlinear. Furthermore,the three dimensional structures of PLT ferroelectric domain can be imaged by PFM. At the same time,surface polarization state may observed by SNDM and PFM.
What problem does this paper attempt to address?