Abstract:Accurate measurements of the nanoscale electromechanical coupling in materials, including piezo and ferroelectrics, twisted 2D layers, and biological systems is of both fundamental scientific and applied importance. Piezoresponse Force Microscopy (PFM) is capable of detecting strains in these materials, down to the picometer range. Following the emergence of weaker materials, the smaller signals associated with them have revealed various crosstalk challenges that have limited the accuracy of measurements. Previous work demonstrated that the use of an interferometric displacement sensor (IDS) positioned appropriately above the tip of the cantilever (x/L~1), where x is the spot position and L is the cantilever length, has enabled sensitive and artifact-free electromechanical measurements. A similar approach has been employed in removing unwanted electrostatic and in-plane response contributions for the optical beam deflection (OBD) measurement technique commonly used in most atomic force microscopes. In the present study, extensive automated sub-resonance spot position dependent PFM measurements were conducted on periodically poled lithium niobate (PPLN). In this work, both IDS and OBD responses were measured simultaneously, allowing direct comparisons of the two approaches. The IDS showed a blind spot at x/L~1, as expected. However, for OBD measurements, the blind spot's location exhibited wider variation, ranging from 0.15<x/L<0.61. Furthermore, the magnitudes of the amplitudes measured with IDS and OBD were typically different, sometimes approaching disagreement by a factor of two. These measurements have important implications, not only for the PPLN measured here, but for more complex and unknown samples that have a heterogeneous polarization and electrical characteristic.

Quantitative Lateral and Vertical Piezoresponse Force Microscopy on A Pbtio3 Single Crystal

Quantitative piezoelectric force microscopy: Influence of tip shape, size, and contact geometry on the nanoscale resolution of an antiparallel ferroelectric domain wall

Accurate 3D Nanoscale Electromechanical Imaging with a Metrological Atomic Force Microscope

Piezo-generated charge mapping revealed through Direct Piezoelectric Force Microscopy

Probing Electromechanical Behaviors by Datacube Piezoresponse Force Microscopy in Ambient and Aqueous Environments

In-plane Polarization Contribution to the Vertical Piezoresponse Force Microscopy Signal Mediated by the Cantilever “Buckling”

Force-Electric Coupling of Nanoscale Ferroelectric Domains Based on Piezoelectric Force Microscopy (PFM)

Depth resolution in piezoresponse force microscopy

Resetting Piezoresponse Force Microscopy: Towards a real quantitative technique

High-Temperature Piezoresponse Force Microscopy

Inspecting Piezoelectricity in PbZr1−x Ti X O3 Single Crystals with Ferroelastic Domains

Nanoscale Ferroelectric Characterization with Heterodyne Megasonic Piezoresponse Force Microscopy

Nanoscale Insight Of High Piezoelectricity In High-T-C Pmn-Ph-Pt Ceramics

Background-free Piezoresponse Force Microscopy for Quantitative Measurements

Piezoresponse Force Microscopy Imaging and Its Correlation with Cantilever Spring Constant and Frequency

Accurate Vertical Nanoelectromechanical Measurements

Scanning Probe Microscopy of Ferroelectric Domains in PMN-PT Single Crystal

Revisiting contrast mechanism of lateral piezoresponse force microscopy

Determination of Imprint Effects in Ferroelectrics from the Quantified Phase and Amplitude Response

Multi‐scale Domain Structure Observation and Piezoelectric Responses for [001]‐oriented PMN‐33PT Single Crystal

Piezoresponse Force Microscopy Studies on the Domain Structures and Local Switching Behavior of Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Single Crystals