Abstract:While piezoelectrics and ferroelectrics are playing a key role in many everyday applications, there are still a number of open questions related to the physics of those materials. In order to foster the understanding of piezoelectrics and ferroelectric and pave the way to future applications, the nanoscale characterization of these materials is essential. In this light, we have developed a novel AFM based mode that obtains a direct quantitative analysis of the piezoelectric coefficient d33. This nanoscale tool is capable of detecting and reveal piezo-charge generation through the direct piezoelectric effect at the surface of the piezoelectric and ferroelectric materials. We report the first nanoscale images of the charge generated in a thick single crystal of Periodically Poled Lithium Niobate (PPLN) and a Bismuth Ferrite (BiFO3) thin film by applying a force and recording the current produced by the materials. The quantification of both d33 coefficients for PPLN and BFO are 13 +- 2 pC/N and 46 +- 7 pC/N respectively, in agreement with the values reported in the literature. This new mode can operate simultaneously with PFM mode providing a powerful tool for the electromechanical and piezo-charge generation characterization of ferroelectric and piezoelectric materials.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is: how to achieve direct quantitative analysis of piezoelectric and ferroelectric materials on the nanoscale, especially by developing a new atomic force microscope (AFM) - based technique to measure the piezoelectric coefficient \(d_{33}\) of these materials. ### Specific problems include: 1. **Limitations of existing technologies**: The existing piezoresponse force microscopy (PFM) technology relies on the converse piezoelectric effect and conducts indirect measurement by applying an alternating - electric field and measuring the deformation of the material. This method has the problem of being difficult to distinguish the piezoelectric response from other physical phenomena (such as ion movement, charging, electrostatic or thermal effects), leading to the challenge of accurately measuring the piezoelectric coefficient \(d_{33}\). 2. **The need for nanoscale characterization**: In order to better understand the physical properties of piezoelectric and ferroelectric materials and pave the way for future applications, accurate characterization of these materials on the nanoscale is required. 3. **Direct measurement of the piezoelectric effect**: Traditional AFM techniques cannot reliably measure the tiny charges generated by the piezoelectric effect, so a new method that can directly measure the piezoelectric effect needs to be developed. ### Solution: The paper introduces a new technique named "Direct Piezoelectric Force Microscopy (DPFM)". This technique utilizes the direct piezoelectric effect to quantitatively measure the charges generated by piezoelectric materials on the nanoscale. Specifically: - **Experimental setup**: Use a special amplifier and a conductive probe to strain the piezoelectric material by applying a force at the micro - newton level and collect the resulting charges. - **Measurement principle**: By recording the current changes under different applied forces, the piezoelectric coefficient \(d_{33}\) can be directly calculated. - **Verification and application**: This technique has been verified on Periodically Poled Lithium Niobate (PPLN) and Bismuth Ferrite (BFO) materials, and the obtained \(d_{33}\) values are consistent with those reported in the literature, which are \(13\pm2\) pC/N and \(46\pm7\) pC/N respectively. In conclusion, this paper aims to overcome the limitations of existing technologies and achieve direct, quantitative, and nanoscale characterization of piezoelectric materials by developing the DPFM technique, thereby providing a powerful tool for future material research and applications.

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