Abstract:Accurate measurements of the nanoscale electromechanical coupling in materials, including piezo and ferroelectrics, twisted 2D layers, and biological systems is of both fundamental scientific and applied importance. Piezoresponse Force Microscopy (PFM) is capable of detecting strains in these materials, down to the picometer range. Following the emergence of weaker materials, the smaller signals associated with them have revealed various crosstalk challenges that have limited the accuracy of measurements. Previous work demonstrated that the use of an interferometric displacement sensor (IDS) positioned appropriately above the tip of the cantilever (x/L~1), where x is the spot position and L is the cantilever length, has enabled sensitive and artifact-free electromechanical measurements. A similar approach has been employed in removing unwanted electrostatic and in-plane response contributions for the optical beam deflection (OBD) measurement technique commonly used in most atomic force microscopes. In the present study, extensive automated sub-resonance spot position dependent PFM measurements were conducted on periodically poled lithium niobate (PPLN). In this work, both IDS and OBD responses were measured simultaneously, allowing direct comparisons of the two approaches. The IDS showed a blind spot at x/L~1, as expected. However, for OBD measurements, the blind spot's location exhibited wider variation, ranging from 0.15<x/L<0.61. Furthermore, the magnitudes of the amplitudes measured with IDS and OBD were typically different, sometimes approaching disagreement by a factor of two. These measurements have important implications, not only for the PPLN measured here, but for more complex and unknown samples that have a heterogeneous polarization and electrical characteristic.

Probing Electromechanical Behaviors by Datacube Piezoresponse Force Microscopy in Ambient and Aqueous Environments

Probing Nanoscale Electromechanical Behaviors of Relaxor Ferroelectrics in Highly Conductive Liquid Environments

Force-Electric Coupling of Nanoscale Ferroelectric Domains Based on Piezoelectric Force Microscopy (PFM)

Electric-Double-Layer Oriented Field-Screening Effect on High-Resolution Electromechanical Imaging in Conductive Solutions

Quantitative Lateral and Vertical Piezoresponse Force Microscopy on A Pbtio3 Single Crystal

Probing Local Electromechanical Effects in Highly Conductive Electrolytes.

Decoupling competing electromechanical mechanisms in dynamic atomic force microscopy

Local Probing of the Non-Uniform Distribution of Ferrielectric and Antiferroelectric Phases

Accurate 3D Nanoscale Electromechanical Imaging with a Metrological Atomic Force Microscope

Nanoscale Ferroelectric Characterization with Heterodyne Megasonic Piezoresponse Force Microscopy

PFM (piezoresponse force microscopy)-aided design for molecular ferroelectrics

Accurate Vertical Nanoelectromechanical Measurements

Accurate electromechanical characterization of soft molecular monolayers using piezo force microscopy

Piezo-generated charge mapping revealed through Direct Piezoelectric Force Microscopy

High-Frequency Electromechanical Imaging of Ferroelectrics in a Liquid Environment

A New Heterodyne Megasonic Piezoresponse Force Microscopy with High-frequency Excitation beyond 100 MHz

Electrokinetics In Micro-Channeled Cantilevers: Extending The Toolbox For Reversible Colloidal Probes And Afm-Based Nanofluidics

Nanoelectromechanics of Piezoresponse Force Microscopy

Nanoscale Piezoresponse, Acoustic and Thermal Microscopy of Electronic Ceramics

Piezoresponse Force Microscopy Imaging and Its Correlation with Cantilever Spring Constant and Frequency