Abstract:Accurate measurements of the nanoscale electromechanical coupling in materials, including piezo and ferroelectrics, twisted 2D layers, and biological systems is of both fundamental scientific and applied importance. Piezoresponse Force Microscopy (PFM) is capable of detecting strains in these materials, down to the picometer range. Following the emergence of weaker materials, the smaller signals associated with them have revealed various crosstalk challenges that have limited the accuracy of measurements. Previous work demonstrated that the use of an interferometric displacement sensor (IDS) positioned appropriately above the tip of the cantilever (x/L~1), where x is the spot position and L is the cantilever length, has enabled sensitive and artifact-free electromechanical measurements. A similar approach has been employed in removing unwanted electrostatic and in-plane response contributions for the optical beam deflection (OBD) measurement technique commonly used in most atomic force microscopes. In the present study, extensive automated sub-resonance spot position dependent PFM measurements were conducted on periodically poled lithium niobate (PPLN). In this work, both IDS and OBD responses were measured simultaneously, allowing direct comparisons of the two approaches. The IDS showed a blind spot at x/L~1, as expected. However, for OBD measurements, the blind spot's location exhibited wider variation, ranging from 0.15<x/L<0.61. Furthermore, the magnitudes of the amplitudes measured with IDS and OBD were typically different, sometimes approaching disagreement by a factor of two. These measurements have important implications, not only for the PPLN measured here, but for more complex and unknown samples that have a heterogeneous polarization and electrical characteristic.

Probing Nanoscale Electromechanical Behaviors of Relaxor Ferroelectrics in Highly Conductive Liquid Environments

Probing Local Electromechanical Effects in Highly Conductive Electrolytes.

Electric-Double-Layer Oriented Field-Screening Effect on High-Resolution Electromechanical Imaging in Conductive Solutions

High-Frequency Electromechanical Imaging of Ferroelectrics in a Liquid Environment

Probing Electromechanical Behaviors by Datacube Piezoresponse Force Microscopy in Ambient and Aqueous Environments

Electrokinetics In Micro-Channeled Cantilevers: Extending The Toolbox For Reversible Colloidal Probes And Afm-Based Nanofluidics

A novel electrochemical atomic force microscope and its applications

Large Electrostrain Induced by Reversible Domain Switching in Ordered Ferroelectric Nanostructures with Optimized Geometric Configurations

Unveiling the Nanoscale Dielectric Gap and Its Influence on Ferroelectric Polarization Switching in Scanning Probe Microscopy

Towards local electromechanical probing of cellular and biomolecular systems in a liquid environment

Mesoscopic Harmonic Mapping of Electromechanical Response in A Relaxor Ferroelectric

Localized electromechanical interactions in ferroelectric P(VDF-TrFE) nanowires investigated by scanning probe microscopy

Numerical Simulation of the Interaction Between Nanodielectrics and the Probe of Electrostatic Force Microscopy

Accurate Vertical Nanoelectromechanical Measurements

High-Performance Electrostrictive Relaxors with Dispersive Endotaxial Nanoprecipitations.

Nanoscale electrical measurements in liquids using AFM - progress and outlook

Bridging experiment and theory of relaxor ferroelectrics at the atomic scale with multislice electron ptychography

A novel scanning force microscopy probe with thermal-electrical actuation and piezo-resistive sensing

Nanoscale mechanical probing of ferroic materials

Scanning Probe Microscopy of Ferroelectric Domains in PMN-PT Single Crystal

Nanoscale Piezoresponse, Acoustic and Thermal Microscopy of Electronic Ceramics