Probing Domain Switching Dynamics in Ferroelectric Thick Films by Small Field E(31,F) Piezoelectric Measurement

Hongbo Cheng,Jun Ouyang,Isaku Kanno
DOI: https://doi.org/10.1063/1.4993164
IF: 4
2017-01-01
Applied Physics Letters
Abstract:Epitaxial Pb(Zr0.53Ti0.47)O3 films were grown on (001) Pt/(001) MgO via rf-magnetron sputtering. Switching dynamics of 90° and 180° domains under bi-polar electric fields were probed by using small-field e31,f measurements in which the evolution of the transverse piezoelectric response with the bias voltage represents a set of fingerprints of the evolving domain structure. Furthermore, the asymmetric e31,f−V curves revealed a strong built-in electric field, which was verified by the standard polarization-electric field hysteresis measurement. Finally, X-ray 2θ-scan patterns under DC bias voltages were collected for the piezoelectric specimen. The domain switching sequence indicated by the XRD results is consistent with that revealed by the e31,f measurement.
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