Abstract:Solar selective absorbers have significant applications in various photothermal conversion systems. In this work, a global optimization method based on genetic algorithm was developed by directly optimizing the solar photothermal conversion efficiency of a nano-chromium (Cr) film-based solar selective absorber aiming to work at the specified working temperature and solar concentration. In consideration of the semi-transparent metal absorption layer employed in multilayered solar selective absorbers, the optical constants of ultrathin Cr film were measured by spectroscopic ellipsometer and introduced into the optimization process. The ultrathin Cr film-based solar selective absorber was successfully designed and fabricated by the magnetron sputtering method for the working temperature at 600 K and a solar concentration of 1 Sun. The measured reflectance spectra of the sample show a good agreement with the numerical simulations based on measured optical constants of ultrathin Cr film. In comparison, the simulated results by using the optical constants of bulk Cr film or literature data exhibit a large discrepancy with the experimental results. It demonstrates the significance of considering the actual optical constants for the semi-transparent metal absorption layer in the design of nano-metal film-based solar selective absorber.

Thin Film Optical Parameters Determination Using Adaptive Simulated Annealing Algorithm

Determining Thin Film Thickness Characterization Using Adaptive Simulated Annealing Algorithm

Thin Film Thickness Determination Using Adaptive Simulated Annealing Algorithm and Conjugate Gradient Algorithm

The Application of New Simulated Annealing Genetic Algorithm in Film Characters Measurement

A New Method for Determination of the Optical Constants and Thickness of Thin Film

Determination of the Optical Constants of Solar-Control Amorphous Silicon Thin Films on Float Glass

Determination of optical constants and thickness of photoactive layer in polymer oslar cells by single transmission measurement

The Research of a Method to Obtain the Optical Parameters of Semiconductor Films

Intensity Shift Correction for Thin Film Optical Parameter Determination

In Situ Optical Characterizations of the Annealing Effects Upon Sno2: F Films by Spectroscopic Ellipsometry

Calculation and analysis of optical parameters of dielectric film by transmission spectrum measurement

Study of Ray Tracing Algorithm in the Scattering of Nano-particle Thin Films

The Application of Genetic Algorithm in Thin Film Characters Measurement

Determination of Optical Parameters of GeTe Semiconductor Films Annealed at Different Temperatures

Effects of Post Annealing Atmosphere on Electrical and Optical Properties of SnO2：F Thin Films

Thickness-dependence of Optical Constants for Ta 2 O 5 Ultrathin Films

Study of Annealing Effects Upon the Optical and Electrical Properties of SnO2:F/SiCxOy Low Emissivity Coatings by Spectroscopic Ellipsometry

Thermal Analysis of LiTaO_3 Film Infrared Detector

Adaptive Simulated Annealing Algorithm for the Fiber Bragg Grating Distributed Strain Sensing

Accurate Design of Solar Selective Absorber Based on Measured Optical Constants of Nano-thin Cr Film

Optimization Algorithm for Ellipsometry Data Inversion of Optical Film