Study on the Carrier Concentration in N-Gaas Homojunction Multilayer Structures by Reflection Spectroscopy

Yh Zhang,Jh Sun,Xy Chen,Wz Shen
DOI: https://doi.org/10.1016/j.physb.2003.12.007
2004-01-01
Abstract:The temperature-dependent near-band-gap reflection spectroscopy measurements have been used to investigate the carrier information in n-GaAs multilayer structures with different doping concentrations, in addition to the exciton polariton effects in undoped layers. By employing the Fresnel matrix method, we have calculated the experimental reflection spectra and derived the temperature-dependent carrier concentrations of different doping levels. The results are found to coincide with those of variable magnetic field Hall measurements, demonstrating that reflection spectroscopy is another choice to reveal the carrier concentration in multilayer structures with different doping levels.
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