Temperature dependent photoluminescence study of exciton localization in Al0.2Ga0.8N epitaxial layer

Feng Wu,Yang Li,Wu Tian,Jun Zhang,Shuai Wang,Jiangnan Dai,Zhihao Wu,Yanyan Fang,Zhe Chuan Feng,Changqing Chen
DOI: https://doi.org/10.1364/oedi.2015.jw3a.1
2015-01-01
Abstract:Exciton localization effect has been observed in Al0.2Ga0.8N layer and localization energy of 10 meV has been obtained by analyzing the temperature dependent photoluminescence (PL) results. Two different thermal quenching mechanisms have been introduced to explain the quenching process of the PL intensity
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