Optical Study of Localized and Delocalized States in Gaasn/Gaas

Xu Z. Y.,Luo X. D.,Yang X. D.,Tan P. H.,Yang C. L.,Ge W. K.,Zhang Y.,Mascarenhas A.,Xin H. P.,Tu C. W.
DOI: https://doi.org/10.1557/proc-798-y5.68
2003-01-01
Abstract:Taking advantages of short pulse excitation and time-resolved photoluminescence (PL), we have studied the exciton localization effect in a number of GaAsN alloys and GaAsN/GaAs quantum wells (QWs). In the PL spectra, an extra transition located at the higher energy side of the commonly reported N-related emissions is observed. By measuring PL dependence on temperature and excitation power along with PL dynamics study, the new PL peak has been identified as a transition of the band edge-related recombination in dilute GaAsN alloy and delocalized transition in QWs. Using selective excitation PL we further attribute the localized emission in QWs to the excitons localized at the GaAsN/GaAs interfaces. This interface-related exciton localization could be greatly reduced by a rapid thermal annealing.
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