Test of Si-PIN Strip Detector by Electronic Method

ZOU Hong,CHEN Hong-fei,ZOU Ji-qing,NING Bao-jun,SHI Wei-hong,TIAN Da-yu,ZHANG Lu

DOI: https://doi.org/10.3969/j.issn.0258-0934.2007.02.002

2007-01-01

Abstract:We have tested the basic performances of the Si-PIN strip detector,which developed by the Institute of Microelectronics of Peking University,with the electronic method.The Si-PIN strip detector is constructed as several strip detectors in one silicon slice,and can be generally used to measure the particle directions in the space exploration.This paper gives a detail description of the electronic test,and discusses the interfere between strips.For our sample,the amount of the cross-disturbance to a neighbour strip is 5.9 per cent.It deqends on the gap between strips and the capacitance of the strips.