R&D of Si PIN Diode and Its Performance Test

LI Chengbo,YUAN Jian,MENG Qiuying,ZHOU Shuhua,ZHANG Lu,ZHANG Taiping,NING Baojun,TIAN Dayu
DOI: https://doi.org/10.3321/j.issn:0253-3219.2006.04.016
2006-01-01
Abstract:The silicon PIN photodiode is an important part of the PbWO4 detector read-out system that will be used in the Photon Spectrometer (PHOS) in the CERN/ALICE experiment. High specific resistivity n-type silicon material is used for the first time in our RD of PIN, and special techniques are employed in the production process to ensure low dark current, high quantum efficiency, and low noise. The PIN diode has a sensitive area of 16 mm×17 mm. The leak current is lower than 5 nA at room temperature, the quantum efficiency in the wavelength range of 400—500 nm is about 82%, and the junction capacity is about 110—120 pF. The noise level (ENC) of PIN+PreAmp system is lower than 600 e at –25℃. The PIN diodes have passed the long-term stability test. The performance of our RD PIN photo-diodes has overall met the ALICE/PHOS requirement.
What problem does this paper attempt to address?