Shielding Effectiveness Measurement of SiP Based on Near-Field Scanning

Li Ding,Zhi-Yong Ding,Xing-Chang Wei
DOI: https://doi.org/10.1109/ICTA48799.2019.9012921
2019-01-01
Abstract:This paper introduces the electromagnetic shielding effectiveness (SE) measurement of the system-in-package (SiP) based on near-field scanning. This method is more flexible compared to the conventional methods. Several key components of this method are introduced, such as near-field scanning platform and the magnetic probe. Measurement of commercial SiPs is performed to show the accuracy of the proposed method.
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