On the Growth Mechanism of the Primary Silicon Particle in a Hypereutectic Al-20 Wt%si Alloy Using Synchrotron X-ray Tomography

J. Wang,Z. Guo,J. L. Song,W. X. Hu,J. C. Li,S. M. Xiong
DOI: https://doi.org/10.1016/j.matdes.2017.09.062
IF: 9.417
2017-01-01
Materials & Design
Abstract:The 3-D morphology of the primary silicon particle (PSP) in a hypereutectic Al-20wt%Si alloy was characterized using synchrotron X-ray tomography. It was found that the most probable particle morphology always had a shape factor of 0.85, indicating either a regular octahedron or a twinned shape with a/h=2.5 (a was the edge length and h was the distance between the outer surface and the {111} plane). A growth transition model was then developed to describe the growth mechanism for the PSPs. It is believed that both octahedral and twinned shapes are a transition from a so-called facetted growth unit, which has a morphology of just half octahedron and evolves from a spherical nucleation. Further growth of the silicon particles can lead to the formation of hollow hoppers due to the mismatch of the growth velocity along different directions.
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