Self-aligned OHR Technology for Metal Lift-off and Substrate Etching

闫桂珍,张大成,李婷,王颖
DOI: https://doi.org/10.3969/j.issn.1671-4776.2002.01.011
2002-01-01
Abstract:An overhang resist technology has thus been developed to solve the challenge.High temperature baking and chlorobenzene treatment are added in the standard lift-off process.The purposes not only retain the resist geometry,but also protect the lateral etching.This technology can simplify the process,make lift-off effective with low cost,and could be extensively applied to current MEMS and IC fabrication.
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