In situ observation of electrical property of thin-layer black phosphorus based on dry transfer method

Xin Xin,Hai-Ming Zhao,Hui-Wen Cao,He Tian,Yi Yang,Tian-Ling Ren
DOI: https://doi.org/10.7567/APEX.9.045202
IF: 2.819
2016-01-01
Applied Physics Express
Abstract:The electrical property of thin-layer black phosphorus (BP) was explored using a simple dry transfer method, which greatly reduced the fabrication time to carry out electrical measurement starting from an initial state with little degradation. As a result, the as-prepared BP field-effect transistor (FET) exhibited a high on/off ratio exceeding 10(4) and a high hole mobility of 380 cm(2)/(V.s). The time-dependent electrical property of BP indicated a declining and recovering process, caused by the degradation and doping effect. Finally, it was demonstrated that the degradation and large hysteresis of BP FET could be modified by covering a thin Al2O3 layer. (C) 2016 The Japan Society of Applied Physics
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