Abstract:Recently FPGA researchers have proposed different approaches to enable dynamic voltage scaling (DVS) for FPGAs. While the proposed approaches have shown that DVS is able to significantly reduce FPGA power consumption, most of these solutions were developed only for the soft fabric of the FPGA and hence cannot be deployed for applications that use the FPGA hard blocks such as block RAMs (BRAMs). In this work, we extend a previously proposed offline calibration-based DVS approach to enable DVS for FPGAs with BRAMs; we build testing circuitry to ensure that all used BRAM cells operate safely while scaling $V_{dd}$, and we develop testing procedures that are able to measure the delay of timing paths that start or end at BRAMs. We extend the CAD tool FRoC to automatically generate calibration designs with BRAM testers along with soft fabric testers to measure the actual $F_{max}$ of each application on any chip under different operating conditions; this information is stored in a calibration table that is then used when the application is running to scale $V_{dd}$ to the minimum value that guarantees safe operation at the desired speed. Using our proposed solution, we show that we can run a discrete Fourier transform core with 32% and 46% power reduction compared to the conventional fixed-voltage operation at the reported $F_{max}$ and at a lower clock frequency, respectively.

A Run-Time Built-in Approach of TID Test in SRAM Based FPGAs

A design-for-test for SRAM-based FPGA interconnect testing

A novel FPGA manufacture-oriented interconnect fault test

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

An Effective Test Method for Block RAMs in Heterogeneous FPGAs Based on a Novel Partial Bitstream Relocation Technique

A Universal Automatic On-Chip Measurement Of Fpga'S Internal Setup And Hold Times

Analysis of TID Failure Modes in SRAM-Based FPGA under Gamma-Ray and Focused Synchrotron X-Ray Irradiation

An Automated Test Framework for SRAM-based FPGA

A Novel Scheme for Application-Dependent Testing of FPGAs

A New Analytical Approach to Evaluate the Radiation Sensitivity of Circuits Implemented on SRAM-Based FPGAs

A Fully Fledged TDC Implemented in Field-Programmable Gate Arrays

Analysis and Test of Time Difference Measurement IP Based on FIB

An Analytical Delay Model for SRAM-based FPGA Interconnections

Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas

A New Built-In Self-Test Method for Functional Test of Configurable Logic Blocks in Modern FPGAs

BIST Approach for Testing Configurable Logic and Memory Resources in FPGAs.

A Microprocessor Based SOC Built-In Test Scheme

FPGA-based Reliability Testing and Analysis for 3D NAND Flash Memory

Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs

A Threshold Voltage Deviation Monitoring Scheme of Bit Transistors in 6T SRAM for Manufacturing Defects Detection

Ipf: In-Place X-Filling Algorithm for the Reliability of Modern Fpgas