The Effect of Multiple Interface States and Nc-Si Dots in a Nc-Si Floating Gate MOS Structure Measured by Their G — V Characteristics

Shi Yong,Ma Zhong-Yuan,Chen Kun-Ji,Jiang Xiao-Fan,Li Wei,Huang Xin-Fan,Xu Ling,Xu Jun,Feng Duan
DOI: https://doi.org/10.1088/0256-307x/30/7/077307
2013-01-01
Abstract:An nc-Si floating gate MOS structure is fabricated by thermal annealing of SiNx/a-Si/SiO2. There are nc-Si dots isolated by a-Si due to partial crystallization. Conductance-voltage (G-V) measurements are performed to investigate the effect of multiple interface states including Si-sub/SiO2, a-Si related (as-deposited sample) and nc-Si (annealed sample) in a charge trapping/releasing process. Double conductance peaks located in the depletion and weak inversion regions are found in our study. For the as-deposited sample, the Si-sub/SiO2 related G-V peak with weak intensity shifts to the negative as test frequency increases. The a-Si related G-V peak with strong intensity shifts slightly with the increasing frequency. For the annealed sample, little change appears in the intensity and shift of Si-sub/SiO2 related G-V peaks. The position of a-Si/nc-Si related peak is independent of frequency, and its intensity is weaker compared to that of the as-deposited sample. It is also found that as the size of nc-Si becomes larger, the a-Si/nc-Si related peak shifts to the depletion region due to the size effect of nc-Si.
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