Low-resistivity bulk silicon prepared by hot-pressing boron- and phosphorus-hyperdoped silicon nanocrystals

qingbin luan,zhenyi ni,setsuko koura,tiejun zhu,deren yang,xiaodong pi
DOI: https://doi.org/10.1063/1.4903550
IF: 1.697
2014-01-01
AIP Advances
Abstract:Technologically important low-resistivity bulk Si has been usually produced by the traditional Czochralski growth method. We now explore a novel method to obtain low-resistivity bulk Si by hot-pressing B-and P-hyperdoped Si nanocrystals (NCs). In this work bulk Si with the resistivity as low as similar to 0.8 (40) m Omega.cm has been produced by hot pressing P (B)-hyperdoped Si NCs. The dopant type is found to make a difference for the sintering of Si NCs during the hot pressing. Bulk Si hot-pressed from P-hyperdoped Si NCs is more compact than that hot-pressed from B-hyperdoped Si NCs when the hot-pressing temperature is the same. This leads to the fact that P is more effectively activated to produce free carriers than B in the hot-pressed bulk Si. Compared with the dopant concentration, the hot-pressing temperature more significantly affects the structural and electrical properties of hot-pressed bulk Si. With the increase of the hot-pressing temperature the density of hot-pressed bulk Si increases. The highest carrier concentration (lowest resistivity) of bulk Si hot-pressed from B-or P-hyperdoped Si NCs is obtained at the highest hot-pressing temperature of 1050 degrees C. The mobility of carriers in the hot-pressed bulk Si is low (<= similar to 30 cm(-2)V(-1)s(-1)) mainly due to the scattering of carriers induced by structural defects such as pores. (C) 2014 Author(s).
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