The origin of the ∼274cm −1 additional Raman mode induced by the incorporation of N dopants and a feasible route to achieve p-type ZnO:N thin films

ping zhang,chunyang kong,wanjun li,guoping qin,qing xu,hong zhang,haibo ruan,yuting cui,liang fang
DOI: https://doi.org/10.1016/j.apsusc.2014.11.147
IF: 6.7
2015-01-01
Applied Surface Science
Abstract:•ZnO:N films were grown on quartz substrates by RF magnetron sputtering technique.•ZnO:N thin films exhibit anomalous variation of ∼274cm−1 Raman mode.•The origin of the ∼274cm−1 mode induced by N dopants is Zni-related defects.•Choosing appropriate N2 flow rate and annealing are the key to achieve p-type ZnO:N.
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