Morphology evolution and emission properties of InGaN/GaN multiple quantum wells grown on GaN microfacets using crossover stripe patterns by selective area epitaxy

zhenlong wu,peng chen,guofeng yang,zhou xu,feng xu,fulong jiang,rong zhang,youdou zheng
DOI: https://doi.org/10.1016/j.apsusc.2015.01.104
IF: 6.7
2015-01-01
Applied Surface Science
Abstract:•Crossover stripe patterns are used to grow GaN microfacet templates.•Temperature-dependent growth of InGaN/GaN MQWs on GaN microfacets is studied.•Local indium content in the MQWs for different microfacets has been investigated.•Polychromatic emissions have been obtained on one single chip.
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