Gan-Based Ridge Waveguides With Very Smooth And Vertical Sidewalls By Icp Dry Etching And Chemical Etching

wanyong li,yi luo,bing xiong,changzheng sun,lai wang,jian wang,yanjun han,jianchang yan,tongbo wei,hongxi lu
DOI: https://doi.org/10.1364/cleo_at.2015.jth2a.24
2015-01-01
Abstract:GaN-based ridge waveguides with very smooth and vertical sidewalls are fabricated with combined inductively coupled plasma (ICP) etching and chemical etching. Reduction in scattering loss is estimated to be 2 dB/mm at 1.55 mu m.
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