STRUCTURAL ANALYSIS OF SiCN FILM PREPARED BY REACTIVE SPUTTERING

XIAO Xing-cheng,JIANG Wei-hui,PENG Xiao-feng,SONG Li-xin,HU Xing-fang
DOI: https://doi.org/10.3969/j.issn.1007-4252.2000.01.011
2000-01-01
Abstract:In this paper, the SiCN films were prepared by reactive magnetron sputtering and the structural analyses were carried out by XPS and FTIR. The results showed that C, N, and Si were bonded with each other. A complex network formed consequently. The stoichiometric proportion of the prepared films is approximately Si:C:N=1:1:1. The FTIR spectra of SiCN films as well as amorphous CN x, SiN y and SiC z films were also given in this paper.
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