Vacancy Compensation and Related Donor-Acceptor Pair Recombination in Bulk AlN

Benjamin E. Gaddy,Zachary Bryan,Isaac Bryan,Ronny Kirste,Jinqiao Xie,Rafael Dalmau,Baxter Moody,Yoshinao Kumagai,Toru Nagashima,Yuki Kubota,Toru Kinoshita,Akinori Koukitu,Zlatko Sitar,Ramon Collazo,Douglas L. Irving
DOI: https://doi.org/10.1063/1.4824731
IF: 4
2013-01-01
Applied Physics Letters
Abstract:A prominent 2.8 eV emission peak is identified in bulk AlN substrates grown by physical vapor transport. This peak is shown to be related to the carbon concentration in the samples. Density functional theory calculations predict that this emission is caused by a donor-acceptor pair (DAP) recombination between substitutional carbon on the nitrogen site and a nitrogen vacancy. Photoluminescence and photoluminescence-excitation spectroscopy are used to confirm the model and indicate the DAP character of the emission. The interaction between defects provides a pathway to creating ultraviolet-transparent AlN substrates for optoelectronics applications.
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