Band offsets in HfTiO/InGaZnO4 heterojunction determined by X-ray photoelectron spectroscopy

gang he,x f chen,j g lv,z b fang,y m liu,k r zhu,z q sun,ming liu
DOI: https://doi.org/10.1016/j.jallcom.2015.04.059
IF: 6.2
2015-01-01
Journal of Alloys and Compounds
Abstract:•Band offsets in HfTiO/InGaZnO4 heterojunction were determined by XPS.•Valence band offset of HfTiO/IGZO heterojunction is determined to be 0.35eV.•Conduction band offset of 1.61eV is deduced for HfTiO/IGZO heterojunction.
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