Realization of Graphene Field-Effect Transistor with High-Κ HCa2Nb3O10 Nanoflake As Top-Gate Dielectric

Wenwu Li,Song-Lin Li,Katsuyoshi Komatsu,Alex Aparecido-Ferreira,Yen-Fu Lin,Yong Xu,Minoru Osada,Takayoshi Sasaki,Kazuhito Tsukagoshi
DOI: https://doi.org/10.1063/1.4813537
IF: 4
2013-01-01
Applied Physics Letters
Abstract:A high-quality HCa2Nb3O10 (HCNO) nanoflake (εr = 9.1) consisting of high-κ perovskite nanosheets is adopted as a gate dielectric for graphene-based electronics. A dual-gated device was physically constructed by directly dry-transferring a 22-nm-thick HCNO nanoflake as a top gate dielectric onto graphene. The fabricated graphene field-effect transistor could be operated at biases <1.5 V with a gate leakage below 1 pA. The top-gate capacitance and mobility of the dual-gated graphene device at room temperature were estimated to be 367 nF/cm2 and 2500 cm2/V · s, respectively. These results show that HCNO can be employed as an alternative dielectric for graphene-based devices.
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