Abstract:Journal Article Determination of Reliable Grain Boundary Orientation using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope Get access Xinming Zhang, Xinming Zhang Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616 USA Search for other works by this author on: Oxford Academic Google Scholar Jorgen F Rufner, Jorgen F Rufner Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616 USA Search for other works by this author on: Oxford Academic Google Scholar Thomas LaGrange, Thomas LaGrange Physical and Life Sciences Directory, Lawrence Livermore National Laboratory, 7000 East Ave, Livermore, CA 94550 USAnow at: Ecole Polytechnique Federale de Lausanne, Interdisciplinary Center of Electron Microscopy, 1015 Lausanne, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Ricardo HR Castro, Ricardo HR Castro Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616 USA Search for other works by this author on: Oxford Academic Google Scholar Julie M Schoenung, Julie M Schoenung Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616 USA Search for other works by this author on: Oxford Academic Google Scholar Geoffrey H Campell, Geoffrey H Campell Physical and Life Sciences Directory, Lawrence Livermore National Laboratory, 7000 East Ave, Livermore, CA 94550 USA Search for other works by this author on: Oxford Academic Google Scholar Klaus van Benthem Klaus van Benthem Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616 USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1663–1664, https://doi.org/10.1017/S1431927615009095 Published: 23 September 2015

Comparison of crystal orientation mapping-based and image-based measurement of grain size and grain size distribution in a thin aluminum film

Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction

Comparing Scanning Electron Microscope and Transmission Electron Microscope Grain Mapping Techniques Applied to Well-Defined and Highly Irregular Nanoparticles

Three-Dimensional Orientation Mapping in the Transmission Electron Microscope

3D Grain Orientation Mapping of Nanocrystalline Materials in the TEM

A machine learning approach to map crystal orientation by optical microscopy

Measurement of the Electron-Phonon Coupling Factor Dependence on Film Thickness and Grain Size in Au, Cr, and Al

Influence of Defects and Crystallographic Orientation on Mechanical Behavior of Nanocrystalline Aluminium

Crystallographic Orientation Dependence of Nanopattern Morphology and Size in Electropolished Polycrystalline and Monocrystalline Aluminum: An EBSD and SEM Study

Grain-resolved kinetics and rotation during grain growth of nanocrystalline Aluminium by molecular dynamics

Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis

Size Effects in Internal Friction of Nanocrystalline Aluminum Films

Grain Size Evolution of Nano-Micro-crystalline Materials Based on Dislocation Density Model

Large effects of nano-crystal size distribution on Raman scattering spectra of nc-Si:H films

Influence of Grain Size in the Near-Micrometre Regime on the Deformation Microstructure in Aluminium

Grain-size Effect on the Preferred Orientation of TiC/α-C:H Thin Films

Study of grain size and polishing performance of aluminum film as metal gate electrode

Critical Comparison of Dislocation Boundary Alignment Studied by TEM and EBSD: Technical Issues and Theoretical Consequences

Characterizing the Nano-Structure and Defect Structure of Nano-Scaled Non-Ferrous Structural Alloys

Determination of Reliable Grain Boundary Orientation Using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope

Grain Orientation Dependence of Extended Planar Dislocation Boundaries in Rolled Aluminium