Abstract:Nanocrystalline materials (i.e. polycrystalline aggregates where the individual crystallites/grains or particles have sizes below 100 nm) are formed through various processes ranging from mechanical treatments of bulk materials, to electrodeposition of thin films and coatings to aggregation of nanoparticles. The materials constitute one of the most rapidly growing new classes of materials and exhibit enhanced properties, see e.g. [1,2], ranging from high strength and wear resistance, to unique functional characteristics, which open up a large spectrum of applications e.g. for micro- and nano-electro-mechanical systems (MEMS and NEMS). Consequently, materials models tend to be based only on simple observables such as a 2D crystalline projection or an average grain/particle size. Motivated by this, a new and non-destructive technique called "3D-Orientation Mapping in TEM" (3D-OMiTEM) was developed and it was demonstrated that both orientation and 3D morphology of ~1000 individual nanograins could be measured with spatial and angular resolutions of 1 nm and 1 degree [3]. Notably, the foil may have five or more grains stacked on top of each other in the thickness direction. Technically speaking, 3D-OMiTEM is based on conical-scanning dark-field imaging. By recording images at a series of different beam and sample tilt angles it is possible to reconstruct the complete 3D orientation map of nanograins or nanoparticles. With the availability of 3D-OMiTEM crystallographic orientation relationships, interface curvatures, 3D connectivity between nanograins or nanoparticles as well as evolution of 3D structures e.g. during heat treatments or deformation steps, can be addressed for the first time in nanocrystalline materials. An overview of the methodology and latest results is given.

3D Grain Orientation Mapping of Nanocrystalline Materials in the TEM

Three-Dimensional Orientation Mapping in the Transmission Electron Microscope

Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction

2D and 3D orientation mapping in nanostructured metals: A review

3D Non-Destructive Grain Orientation Mapping of Polycrystalline Materials Using 3D-XRD and TEM

A machine learning approach to map crystal orientation by optical microscopy

Comparing Scanning Electron Microscope and Transmission Electron Microscope Grain Mapping Techniques Applied to Well-Defined and Highly Irregular Nanoparticles

Direct Observation of Disconnection-Mediated Grain Rotation

Precession Electron Diffraction Assisted Orientation Mapping of Gradient Nanostructure in a Ni-based Superalloy

Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization

3D Characterization of Abnormal Grain Growth in Nanocrystalline Nickel

Towards 3D crystal orientation reconstruction using automated crystal orientation mapping transmission electron microscopy (ACOM-TEM)

3 D Orientation Imaging with Transmission Electron Microscopy

Comparison of crystal orientation mapping-based and image-based measurement of grain size and grain size distribution in a thin aluminum film

Five-parameter grain boundary character distribution of gold nanoparticles based on three dimensional orientation mapping in the TEM

Grain rotation mechanisms in nanocrystalline materials: Multiscale observations in Pt thin films

Mapping Grain Morphology and Grain Orientations by Laboratory Diffraction Contrast Tomography

High Precision Orientation Mapping from 4D-STEM Precession Electron Diffraction data through Quantitative Analysis of Diffracted Intensities

3D grain orientation mapping of polycrystals on scales from 1 mm to 1 nm using 3D XRD and TEM

Characterizing the Nano-Structure and Defect Structure of Nano-Scaled Non-Ferrous Structural Alloys

Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy