Abstract:Continuously scaling down and decreasing operation voltages of ICs, from the 5 V TTL-compatible voltage to 3.3 V, then 1.2 V, and now 0.8 V for low-power ICs, results in more stringent electrostatic discharge protection design requirements, such as a narrow ESD design window, low operation voltage, and high ESD robustness. Based on traditional diode string and diode-triggered silicon-controlled rectifiers, an enhanced diode-triggered silicon-controlled rectifier is proposed to meet the requirements of low-voltage integrated circuits as bidirectional electrostatic discharge protection. The new device employs an additional PMOS and NMOS in the N-well and P-well, respectively, to offer additional current paths along the surface to significantly enhance its robustness. TCAD simulation shows that the device is triggered by both the diode strings and embedded MOS, making the device turn on faster and the current distribution more uniform during the ON state owing to the additional surface current paths. The proposed new device has excellent dual-directional ESD protection performance with a figure of merit of 4.01 mA/um2, which is about a 71% improvement compared with the conventional diode-triggered silicon-controlled rectifier. It also has higher area efficiency, lower trigger voltage, lower current leakage, and a faster turn-on speed. The proposed enhanced diode-triggered silicon-controlled rectifier is an attractive ESD protection solution for ultra-low-voltage ICs.

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