Demonstration of L-Shaped Tunnel Field-Effect Transistors
Sang Wan Kim,Jang Hyun Kim,Tsu-Jae King Liu,Woo Young Choi,Byung-Gook Park
DOI: https://doi.org/10.1109/ted.2015.2472496
IF: 3.1
2016-04-01
IEEE Transactions on Electron Devices
Abstract:An L-shaped tunnel FET (TFET), which features band-to-band tunneling (BTBT) perpendicular to the channel direction, is experimentally demonstrated for the first time. It is more scalable than other vertical-BTBT-based TFET designs and provides more than $1000\times $ higher ON-current ( $I_{{\mathrm{\scriptscriptstyle ON}}}$ ) than a conventional planar TFET with the same gate overdrive ( $V_{\mathrm{ov}}$ ) of 0.8 V, due to improved subthreshold swing ( $S$ ) and larger tunnel junction area. Its temperature dependence, constant $S$ , and nonlinear output characteristics are discussed.
engineering, electrical & electronic,physics, applied