A Novel Tunnel FET Design Through Adaptive Bandgap Engineering with Constant Sub-Threshold Slope over 5 Decades of Current and High $\text{i}_{\mathrm {on}}/\text{i}_{\mathrm {OFF}}$ Ratio
Yang Zhao,Chunlei Wu,Qianqian Huang,Cheng Chen,Jiadi Zhu,Lingyi Guo,Rundong Jia,Zhu Lv,Yuchao Yang,Ming Li,Ru Huang
DOI: https://doi.org/10.1109/led.2017.2679031
IF: 4.8157
2017-01-01
IEEE Electron Device Letters
Abstract:In this letter, a novel hetero-stacked TFET (HS-TFET) is experimentally demonstrated and optimized for the first time, which can effectively suppress the subthreshold slope (SS) degradation without leakage current increase through self-adaptively current replenishing with bandgap engineering, greatly alleviating the critical issue of high average SS in conventional TFETs. Based on CMOS-compatible technology, the fabricated HS-TFETs of vertically stacked Si-Si1-xGex source can experimentally achieve superior performance with nearly constant SS over five decades of drain current, high Ion (similar to 14 mu A/mu m @ V-DS = -1 V), and large Ion/Ioff ratio (similar to 10(7)). The proposed device with high process compatibility shows great potentials for future ultra-low power applications.