Numerical Study on a Lateral Double-Gate Tunnelling Field Effect Transistor

He Jin,Bian Wei,Tao Ya-Dong,Liu Feng,Song Yan,Zhang Xing
DOI: https://doi.org/10.1088/0256-307x/23/12/070
2006-01-01
Chinese Physics Letters
Abstract:A novel lateral double-gate tunnelling field effect transistor (DG-TFET) is studied and its performance is presented by a two-dimensional device simulation with code ISE. The result demonstrates that this new tunnelling transistor allows for the steeper sub-threshold swing below 60 mV/dec, the super low supply voltage (operable at VDD<0.3 V) and the rail-to-rail logic (significant on-state current at the drain-source voltage VDS = 50 mV) for the aggressive technology assumptions of the availability of high-k/metal stack with equivalent gate oxide thickness EOT = 0.24 nm and the work function difference 4.5 eV of materials.
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