Annealing temperature effect on internal strain and ferroelectric properties of Bi3.25La0.75Ti3O12 thin films

XiuMei Wu,Yi Kan,Xiaomei Lü,Jinsong Zhu,Ya Zhai
DOI: https://doi.org/10.1080/00150193.2010.505786
2010-01-01
Ferroelectrics
Abstract:The annealing temperature impact on the internal strain and the ferroelectric properties of Bi3.25La0.75Ti3O12 thin films was studied. It is found that, with the annealing temperature increasing, the internal strain in films first decreases (below 720 degrees C) and then increases (at 750 degrees C), while the volume fraction of a-axis-oriented grains, the remnant polarization and the coercive field first increase (below 720 degrees C) and then decrease (at 750 degrees C). These experimental results show that the properties of the Bi3.25La0.75Ti3O12 thin films can be directly influenced by the annealing temperature.
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