Latest development of MnSi1.7 semiconducting films

Wei Zhao,Qingrun Hou,Yibao Chen,Yuanjin He
2008-01-01
Abstract:The latest progress in the growth technologies and properties characterization of the MnSi1.7 semi-conducting films was reviewed. MnSi1.7 semiconducting film could be a promising material in fabricating optical devices, including infrared detectors, miniaturized thermo-electric generators etc. Discussions focused on the technical advantages of the infrared detectors made of MnSi1.7 semi-conducting films over those of the conventional ones, such as the PtSi and Bi1-xSbxdetectors. The technologies of impurity doping and of nanostructures fabrication were also discussed. The p-type and n-type MnSi1.7 films with low resistivity can be obtained by doping of different impurities. Besides, after the films thinned to 14nm, the Seebeck coefficient reaches -967μV·K-1 at a temperature of 483K.
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